Brian P. Lynch

Registered Patent Agent



Direct    +1 312 755 8581


Brian Lynch is a registered patent agent with the U.S. Patent and Trademark Office. He received his bachelor’s degree in chemistry from Colorado College and his doctorate in chemistry from Purdue University.

Brian’s undergraduate research focused on using gas chromatography mass spectrometry to perform multivariate analysis of the monoterpene content of conifers. His thesis research focused on using an atomic force microscope to perform nanoscale dielectrophoretic spectroscopy of erythrocytes in solution. This research led to publications in Langmuir, Analytical Chemistry, Biophysical Journal, American Laboratory, and the Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. In addition, he has presented his research at national chemistry conferences. Brian’s research experience also includes investigating the social structure of the naked mole rat and working at a biotech start-up company on developing immunoassays for label-free interferometric detection.

Brian has extensive experience drafting, prosecuting and licensing patents. He has worked for a wide range of clients over many technical disciplines, including the furniture, agricultural machinery, fermentation, shipping container and vehicle tracking industries.

Brian’s publications include:

  • Hilton, A. M.; Jacobson, K. W.; Lynch, B. P.; Simpson, G. J., Enhanced local oxidation of silicon using a conducting atomic force microscope in water. Journal of Vacuum Science & Technology B 2008, 26, (1), 47-51.
  • Lynch, B. P.; Hilton, A. M.; Simpson, G. J., Nanoscale dielectrophoretic spectroscopy of individual immobilized mammalian blood cells. Biophysical Journal 2006, 91, (7), 2678-2686.
  • Hilton, A. M.; Lynch, B. P.; Simpson, G. J., Dielectrophoretic force microscopy. American Laboratory (Shelton, CT, United States) 2006, 38, (8), 23-25.
  • Hilton, A. M.; Lynch, B. P.; Simpson, G. J., Reduction of Tip-Sample Contact Using Dielectrophoretic Force Scanning Probe Microscopy. Analytical Chemistry 2005, 77, (24), 8008-8012.
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